Are you content with the results from surface profile inspections performed using the SEM?
*SEM = Scanning Electron Microscope
- It takes a considerable amount of time to get the result. The result should be made available more quickly in a timely manner.
- A specimen must be cut into small pieces and deposited with a chemical coating. Therefore the specimen can not be observed "as-is".
- Images alone are not enough. Height and roughness information are also required.
- The overall SEM setup procedure and operation are cumbersome. For example, high vacuum may be required.
- Do you think that it is impracticable to analyze the roughness in minute areas, such as the roughness on the surface of a metal bump, or on the pad of a PCB?
- Do you consider it unavoidable for a specimen to get scratched?
- Do you think that it is impossible to analyze the roughness on a sticky surface, such as on a surface with adhesive applied?
- There are types of defects that cannot be observed using the optical microscope.
- One- or two-dimensional information is insufficient to make correct evaluations. Three-dimensional information is required.
- Due to ever decreasing manufacturing tolerance values, high-accuracy measurement is now a mandatory function for microscopes.
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