Near-Infrared System Microscope MX-IR/BX-IR
Model Dedicated to Near-infrared (IR) Observation Capable of Internal Observation of an IC (for Both Reflected and Transmitted Observations)
Equipped with an IR-dedicated objective lens corrected for apochromatic aberrations from visible light up to near-infrared region and digital enhancer system, this model can easily perform internal observation of an IC. The MX/BX series is selectable according to the size of a specimen and application.
Near-Infrared System Microscope BX51-IR
Near-Infrared System Microscope MX61-IR
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| Wafer (IR) | Wafer (IR) |
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| Wafer (IR) | Wafer (IR) |
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