Industrial Inspection Microscope MX51
Microscope System for 150mm dia. Wafer/Glass Substrate Use with the Reflected/ Transmitted Illumination
This model supports a variety of microscopy methods from brightfield to fluorescence observations. Thanks to high extensibility, this model is compatible with a wide range of specimens, thus being excellent in cost performance.
Industrial Inspection Microscope MX51
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| Wafer (Brightfield) | Wafer (Darkfield) |
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| Wafer (DIC) | Color Filter (Transmitted)) |
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