IR (Infrared) Observation
IR observation is the preferred method of inspecting the inside of electronic devices using materials which transmit IR, like silicon or film. It is especially suitable for inspecting semiconductor substrates, and is widely used in contemporary CSP (chip scale package) research and development programs. IR objectives are also used with the near-infrared ray Raman spectroscope and laser repair purposes using a (1,064nm) YAG laser.
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